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  Off-plane displacement in one dimension phase-shifting electronic speckle pattern interferometer
Off-plane displacement in one dimension phase-shifting electronic speckle pattern interferometer

TS-SI-1ZP off-plane displacement in one dimension phase-shifting electronic speckle pattern interferometer

             Off-plane displacements in one dimension phase-shifting electronic speckle pattern interferometercan real-time observe interference fringes of surface displacement. With three points bending beam loading experimental device and disc stability under uniformly distributed load (pressure) or concentrated force experimental device, the whole system is more stable and reliable, easier adjustment, which has obtained a better teaching effect.

Main Technical Specification:

¡ôLight source: Semiconductor laser (Green light)output power is 20mW, Wavelength is 532nm

¡ôCamera£º1280¡Á1024 USB2.0 digital camera

¡ôLens: 25mm fixed prime lens(standard configuration), other C interface lens is optional

¡ô  Working Distance£º400¡«1000mm

¡ô  Phase shifter£º10nm

¡ô Fringe resolution: 1/20 fringe

¡ôMaximum range£º ¦µ250mm

¡ôPhase shift control precision: 0.01V

Major Dispositions:

Computer:1

20mW diode-pumped solid-state laser (built-in):1

C interface camera£¨f25mm£©AVENIR:1

TS-1000USB Camera (built in):1

600mm*900mm optical platform :1

Disk under uniformly distributed load (stress) experimental device:1

Fringe real-time display software, phase shift software: one set for each

 

 Principle diagram£º

 

            Off-plane displacement in one dimension phase-shifting electronic speckle pattern interferometer is based on Michelson interferometer£¬When the object has off-plane displacement, the strength of  interference field will follow the changes of the optical path between object light and the reference light.changes of Interference field following changes of the optical path between the object light and the reference light when the object has off-plane displacement, and record speckle interference pattern, we can get the only stripe which reflect changes after phase subtraction.

 

Application scope

Can be used to measure the mirco off-plane displacement distribution of the object to be tested


application:

Nondestructive Testing  for composite materials

Education:

Experiment Teaching of material mechanics and experimental mechanics ; Demo surface off-plane  distribution of disk under uniformly distributed load.

Scientific Research:

Measurement of any trial off-plane displacement distribution surface.

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